Phase change memory cell with large electrode contact area

ABSTRACT

A phase change memory cell and a method for fabricating the phase change memory cell. The phase change memory cell includes a bottom electrode and a first non-conductive layer. The first non-conductive layer defines a first well, a first electrically conductive liner lines the first well, and the first well is filled with a phase change material in the phase change memory cell.

BACKGROUND

This invention relates to computer memory, and more particularly to amethod for fabricating phase change memory cells.

Phase change memory cells are known to have failure modes. One exampleis an endurance failure that occurs after cycling a phase change memorycell many times between the crystalline (SET) and amorphous (RESET)states. Phase change memory cycling results in the phase change materialbecoming disconnected from an electrode and causing the cell to beelectrically open with no current passing through. A root cause of thisfailure is a separation of the phase change material from a bottomelectrode material.

Another example is a process induced failure leading to delamination ofa phase change material. In this failure mode, high temperatureprocesses throughout the processing of an integrated structure cause thephase change material shrink and form voids at corners. This causes thephase change material in the phase change memory cell to delaminate atits interfaces leaving the cell electrically open with no currentpassing through.

BRIEF SUMMARY

Accordingly, one example aspect of the present invention is a phasechange memory cell. The phase change memory cell includes a bottomelectrode and a non-conductive layer deposited above the bottomelectrode. The non-conductive layer defines a well. The well ispositioned above the bottom electrode. An electrically conductive linerlines the well. The electrically conductive liner at least partiallylines the well and is in electrical contact with the bottom electrode. Aphase change material is deposited in the well. The phase changematerial is in electrical contact with the electrically conductiveliner.

Another example of the present invention is a method for fabricating aphase change memory cell. The method includes forming a bottom electrodeand depositing a non-conductive layer above the bottom electrode. Adefining step defines a well of arbitrary shape in the non-conductivelayer and a lining step is used to line an electrically conductive lineralong the side(s) and bottom of the well. A depositing step deposits aphase change material in the well such that the phase change material isin electrical contact with the electrically conductive liner. Theelectrically conductive liner is also in electrical contact with thebottom electrode.

BRIEF DESCRIPTION OF THE DRAWINGS

The subject matter which is regarded as the invention is particularlypointed out and distinctly claimed in the claims at the conclusion ofthe specification. The foregoing and other objects, features, andadvantages of the invention are apparent from the following detaileddescription taken in conjunction with the accompanying drawings inwhich:

FIG. 1A shows a phase change memory cell according to one embodiment ofthe present invention.

FIG. 1B shows another embodiment of a phase change memory cellcontemplated by the present invention.

FIG. 2 shows the phase change memory cell according to anotherembodiment of the present invention.

FIG. 3A shows a phase change memory cell according to one embodiment ofthe present invention.

FIG. 3B shows another phase change memory cell according to oneembodiment of the present invention.

FIG. 4 shows a method for fabricating a phase change memory cell inaccordance with one embodiment of the present invention.

FIGS. 5A and 5B show a method for fabricating a phase change memory cellin accordance with one embodiment of the present invention.

FIGS. 6A and 6B show a further method for fabricating a phase changememory cell in accordance with one embodiment of the present invention.

DETAILED DESCRIPTION

The present invention is described with reference to embodiments of theinvention. Throughout the description of the invention reference is madeto FIGS. 1-6B. When referring to the figures, like structures andelements shown throughout are indicated with like reference numerals.

FIG. 1A shows a phase change memory cell 102 according to one embodimentof the present invention. The phase change memory cell 102 includes abottom electrode 104 and a first non-conductive layer 106. The firstnon-conductive layer 106 is deposited above the bottom electrode 104 anddefines a first well 108. As used herein, the term first well may alsobe referred to as a lower pore. The first well of arbitrary shape 108 ispositioned directly above the bottom electrode 104. A first electricallyconductive liner 110 lines at least one wall of the first well 108. Asused herein, the term electrically conductive liner may also be referredto as an electrode material layer. The first electrically conductiveliner 110 partially fills the first well 108 and is in electricalcontact with the bottom electrode 104.

A phase change material 112 is deposited in the first well 108 and is inelectrical contact with the electrically conductive liner 110. In phasechange memory, information is stored in materials that can bemanipulated into different phases. Each of these phases exhibitdifferent electrical properties which can be used for storinginformation. The amorphous and crystalline phases are typically twophases used for bit storage (1's and 0's) since they have detectabledifferences in electrical resistance. Specifically, the amorphous phasehas a higher resistance than the crystalline phase.

In one embodiment, glass chalcogenides are utilized as phase changematerial. This group of materials contain a chalcogen (Periodic TableGroup 16/VIA) and a more electropositive element. Selenium (Se) andtellurium (Te) are the two most common semiconductors in the group usedto produce a glass chalcogenide when creating a phase change memorycell. An example of this would be Ge₂Sb₂Te₅ (GST), SbTe, and In₂Se₃.However, some phase change materials do not utilize chalcogen, such asGeSb. Thus, a variety of materials can be used as phase change materialcell as long as they can retain separate amorphous and crystallinestates.

The phase change memory cell 102 may further include a top electrode114. The first electrically conductive liner 110 may be in physicalcontact with both the bottom electrode 104 and the top electrode 114.The phase change material 112 may also be in physical contact with boththe bottom electrode 104 and the top electrode 114.

In one embodiment, the phase change material 112 is in physical contactwith both the first electrically conductive liner 110 and the bottomelectrode 104. Alternatively, as shown in FIG. 1B, the conductive liner110 may line the bottom of the first well 108. Thus, the conductiveliner 110 is physically positioned between the phase change material 112and the bottom electrode 104.

FIG. 2 shows the phase change memory cell according to anotherembodiment of the present invention. As shown, the phase change memorycell 102 includes a second non-conductive layer 116 deposited above thefirst non-conductive layer 106. The second non-conductive layer 116defines a second well 118. It is noted that the second non-conductivelayer 116 may be the same material as the first non-conductive layer106, thereby constituting a single unitary layer. Alternatively, thesecond non-conductive layer 116 and first non-conductive layer 106 maybe composed of different materials. The wells formed in these layers (orlayer) can be defined with an etch or any other method to form a well ofarbitrary shape.

The second well 118 is positioned directly above the first well 108. Thephase change material 112 is deposited in the second well 118. The phasechange memory cell 102 may further include a top electrode 114positioned above the second well 118. The top electrode 114 may be inphysical contact with the phase change material 112 in the second well.Alternatively, phase change material is deposited to fill the first welland above the well, followed by the top electrode material deposition,and is then pattered with Reactive Ion Etching (RIE) and encapsulatedwith insulating layer 116.

FIG. 3A shows the phase change memory cell according to anotherembodiment of the present invention. As shown, the phase change memorycell 102 includes a second electrically conductive liner 120. The secondelectrically conductive liner 120 may line at least one wall of thesecond well 118. The second electrically conductive liner 120 may not bein physical contact with the first electrically conductive liner 110. Inanother embodiment, the second electrically conductive liner 120 may bein physical contact with the first electrically conductive liner 110.

In one embodiment, the phase change material 112 is deposited in thefirst well 108 and defines a cavity within the second well 118. Thephase change memory cell 102 further includes a third non-conductivematerial layer 122. The third non-conductive layer 122 is depositedabove the phase change material 112 and inside the second well 118. Thephase change memory cell 102 may further include a top electrode 114.The top electrode 114 is positioned above the third non-conductivematerial layer 122. The top electrode 114 may be in physical contactwith the third non-conductively material layer 122, the phase changematerial 112 layer, and the second electrically conductive liner 116. Inone embodiment, the top electrode 114 may include materials such as Ti,TiN and W.

In one embodiment, the phase change material 112 is in physical contactwith both the first electrically conductive liner 110 and the bottomelectrode 104. Alternatively, as shown in FIG. 3B, the conductive liner120 b may line the bottom of the first well 108. Thus, the conductiveliner 120 b is physically positioned between the phase change material112 b and the bottom electrode 104. Alternatively, the conductive liner120 b may also line the bottom of the first well 108. Thus, theconductive liner 120 b is physically positioned between the phase changematerial 112 b and the bottom electrode 104.

The conductive liner 120 b may be in physical contact with both thebottom electrode 104 and the top electrode 114 b. Thus, the conductiveliner 120 b and the phase change material are arranged in parallelcircuit between the top and bottom electrodes. The resistance of theconductive liner material may be at least two times the resistance ofthe phase change material when in the fully crystalline (SET) state. Theconductive liner thickness may be in the range of 0.5 nm to 5 nm and maybe comprised of TiN, TaN, TaAlN, TaSiN, TiAlN, TiSiN, TiCN, or TaCN.

It is noted that the second non-conductive layer 116 may be the samematerial as the first non-conductive layer 106, thereby constituting asingle unitary layer. Alternatively, the second non-conductive layer 116and first non-conductive layer 106 may be composed of differentmaterials. The wells formed in these layers (or layer) can be definedwith an etch or any other method to form a well of arbitrary shape.

FIG. 4 shows a method for fabricating a phase change memory cell inaccordance with one embodiment of the present invention. The methodincludes forming step 404. During forming step 404, a bottom electrodeis formed. The bottom electrode may comprise materials such as Ti, TiNand W. After forming step 404 is complete, the method continues todepositing step 406.

During depositing step 406, a first non-conductive layer is depositedabove the bottom electrode. In one embodiment, the first non-conductivelayer is made of SiN. After the depositing step 406 is complete, themethod continues to defining step 408.

During defining step 408, a first well is defined in the firstnon-conductive layer. The first well is positioned directly above thebottom electrode. This step may include transferring a keyhole cavitydown to the first non-conductive layer to form the first well. After thedefining step 408 is complete, the method continues to lining step 410.

At lining step 410, a first electrically conductive liner is lined alongat least one wall of the first well. The electrically conductive linerpartially fills the first well and is in electrical contact with thebottom electrode. In one embodiment, the electrically conductive lineris TiN. In other embodiments the electrically conductive liner is TaN,TaAlN, TaSiN, TiAlN, TiSiN, TiCN, or TaCN. After lining step 410 iscomplete, the method continues to depositing step 412.

During depositing step 412, a phase change material is deposited in thefirst well. The phase change material may be in electrical contact withthe electrically conductive liner. As discussed above, a variety ofmaterials may be used for the phase change material. The phase changematerial may include Ge₂Sb₂Te₅. The phase change material may includeSb_(x)Te_(1-x) material, where 0.4 (Sb₂Te₃)<=x<=0.7 (Sb₇Te₃). The phasechange memory cells may include In₂Se₃. After depositing step 412 isfinished, the method proceeds to forming step 414.

At forming step 414, a top electrode is formed. The first electricallyconductive liner may be in physical contact with both the bottomelectrode and the top electrode. In one embodiment, the top electrode isTiN. The phase change material may be in physical contact with both thebottom electrode and the top electrode. In another embodiment the topelectrode and the bottom electrode are comprised of TiAlN, or TaAlN, orTaN, or TiSiN, or TaSiN.

FIGS. 5A and 5B show another method for fabricating a phase changememory cell in accordance with one embodiment of the present invention.The method includes forming step 404, depositing step 406, defining step408, lining step 410, and depositing step 412 discussed above.

After depositing step 406 is performed, the process continues todepositing step 502. At depositing step 502, a second non-conductivelayer is deposited above the first non-conductive. In one embodiment,the second non-conductive layer is SiO₂. After depositing step 502 isfinished, the method continues to defining step 504.

During the defining step 504, a second well is defined in the secondnon-conductive layer. In one embodiment, the second well is formedbefore the first well is defined at defining step 408. This step mayinclude performing a lithographic etch and a buffered oxide etch (BOE)to create the second well, with an overhang above the secondnon-conductive layer. The second well is then filled with a conformalmaterial such that a keyhole cavity is formed within the via. Afterdefining step 418 is finished, the method continues to defining step408.

As mentioned above, defining step 408 may include transferring thekeyhole cavity down to the first non-conductive layer to form the firstwell. After the defining step 408 is complete, the method continues tolining steps 506 and 410.

At lining steps 506 and 410, a second electrically conductive liner islined along at least one wall of the second well and a firstelectrically conductive liner is lined along at least one wall of thefirst well, respectively. The electrically conductive liner partiallyfills the first and second wells. These steps may be followed with areactive ion etch (RIE) to remove the second liner along the bottom ofthe second well. In one embodiment, the first and second electricallyconductive liners are TiN. In other embodiments, the first and secondelectrically conductive liners are TaN, TaAlN, TaSiN, TiAlN, TiSiN,TiCN, or TaCN. After lining step 410 is complete, the method continuesto depositing steps 508 and 412.

At depositing steps 508 and 412, phase change material is deposited inthe first and second wells, respectively. The phase change material maybe in electrical contact with the electrically conductive liner. Asdiscussed above, a variety of materials may be used for the phase changematerial. The phase change material may include Ge₂Sb₂Te₅. The phasechange material may include Sb_(x)Te_(1-x) material, where 0.4(Sb₂Te₃)<=x<=0.7 (Sb₇Te₃). The phase change memory cells may includeIn₂Se₃. After depositing steps 508 and 412 are completed, the methodproceeds to forming step 510.

During forming step 510, a top electrode is formed above the secondwell. In one embodiment, the top electrode is TiN. The top electrode maybe in physical contact with the phase change material in the secondwell.

FIGS. 6A and 6B show a method for fabricating a phase change memory cellin accordance with a further embodiment of the present invention. Themethod includes forming step 404, depositing step 406, depositing step502, defining step 504, defining step 408, lining step 506, lining step410, depositing step 508, and depositing step 412, as discussed above.After depositing step 508 is complete, the method continues todepositing step 602.

During depositing 602, a third non-conductive material layer isdeposited above the phase change material and within the second well. Inone embodiment, the third non-conductive material layer is comprised ofSi3N4.

Depositing step 602 may include spinning on a NFC (near frictionlesscarbon) material which will planarize the surface. Next, a RIE etch isperformed to etch back the NFC. The exposed SiN layer is thenselectively etched using DHF or hot phosphoric acid. Next, the exposedphase change material is etched using RIE or wet etch, for example.Finally, the NFC is removed using RIE or wet etch. After depositing step602 is complete, the method continues to forming step 604.

During the forming step 604, a top electrode material is formed abovethe third non-conductive material layer. The top electrode material maybe physical contact with the third non-conductively material layer, thephase change material layer, and the second electrically conductiveliner. In one embodiment, forming step 604 may include an Ar sputterclean, a Ti deposition, a CVD and TiN deposition, and a CVD and Wdeposition.

Accordingly, one embodiment of the invention is a phase change memorycell with a volume of phase change material connecting the top electrodeand the bottom electrode. The phase change material is programmablebetween the fully crystalline and fully amorphous states, and may alsobe programmed in a partially amorphous state. In one embodiment of theinvention, the phase change material may be in parallel to a conductiveliner material. In this arrangement, the non-phase change material alsomakes a connection between the top electrode and bottom electrode. Theeffective resistance of the phase change memory cell is also theresistance of the phase change material in parallel with the conductiveliner.

If the conduction path has the conductive liner material and the phasechange material in parallel, the cell may require that the resistivityof the conductive liner material be greater than the resistivity of thephase change material when in the crystalline state (SET state). Forexample, the resistance of the conductive liner material may be at leasttwo times the resistance of the phase change material when in the fullycrystalline (SET) state.

Embodiments of the invention include a phase change memory cellstructure and a method to build said structure. The phase change memorycell advantageously includes a large surface area of contact between thephase change material and the electrode material while to maintaining asmall effective electrode cross-sectional area.

In one embodiment, the first well is filled partially with the phasechange material and partially with an electrode material layer. TiN orTaN may be used for the electrode material layer. Al, Si, C, or N dopingmay also be used inside of the electrode material layer to increase theresistivity. In one embodiment of the invention, a reactive ion etch(RIE) may be used to remove the electrode material layer in physicalcontact with and parallel to the first non-conductive layer. In thisembodiment, the phase change material may be deposited to completelyfill the lower pore.

In one embodiment, the phase change material of the phase change memorycell fills the second well entirely and the electrically conductiveliner is disconnected between the first well and the second well, thethermodynamic properties and electro-conductive properties may be tunedto prevent an increased programming current that may result from heatconduction along the lower pore. This embodiment may have cellcharacteristics in between a standard mushroom cell with a lower porecompletely filled with a non-phase change conductive material, and acell with no electrically conductive liner such that the lower pore isfilled with a phase change material only.

In one embodiment, the phase change material fills the lower pore andlines a cavity in the second non-conductive layer. In this embodiment,there can be a third non-conductive layer deposited above the phasechange material layer. Si3N4 may be used for the third non-conductivelayer. In another embodiment the third non-conductive layer may beselectively etched using compositions such as DHF or phosphoric acid.The phase change material of this embodiment may also be etched usingRIE or wet etch.

In one embodiment, a top electrode material may be deposited above thethird non-conductive layer such that it is also in contact with thephase change material and the electrically conductive liner. The topelectrode material may include Ti, TiN, TaN, and W.

The descriptions of the various embodiments of the present inventionhave been presented for purposes of illustration, but are not intendedto be exhaustive or limited to the embodiments disclosed. Manymodifications and variations will be apparent to those of ordinary skillin the art without departing from the scope and spirit of the describedembodiments. The terminology used herein was chosen to best explain theprinciples of the embodiments, the practical application or technicalimprovement over technologies found in the marketplace, or to enableothers of ordinary skill in the art to understand the embodimentsdisclosed herein.

1. A phase change memory cell comprising: a bottom electrode; a firstnon-conductive layer deposited above the bottom electrode; a first welldefined by the first non-conductive layer and positioned directly abovethe bottom electrode; a first electrically conductive liner at leastpartially lining the first well such that the electrically conductiveliner is in electrical contact with the bottom electrode; and a phasechange material deposited in the first well such that the phase changematerial is in electrical contact with the electrically conductiveliner; a top electrode; and wherein the first electrically conductiveliner is in physical contact with both the bottom electrode and the topelectrode; and wherein the phase change material is in physical contactwith both the bottom electrode and the top electrode.
 2. (canceled) 3.The phase change memory cell of claim 1, wherein the conductive linerlines the bottom of the first well such that the conductive liner isphysically positioned between the phase change material and the bottomelectrode.
 4. A phase change memory cell comprising: a bottom electrode;a first non-conductive layer deposited above the bottom electrode; afirst well defined by the first non-conductive layer and positioneddirectly above the bottom electrode; a first electrically conductiveliner at least partially lining the first well such that theelectrically conductive liner is in electrical contact with the bottomelectrode; a phase change material deposited in the first well such thatthe phase change material is in electrical contact with the electricallyconductive liner; a second non-conductive layer deposited above thefirst non-conductive layer; and a second well defined by the secondnon-conductive layer and positioned directly above the first well; and asecond electrically conductive liner lining at least one wall of thesecond well such that the second electrically conductive liner is not inphysical contact with the first electrically conductive liner; whereinthe phase change material is deposited in the second well; and whereinthe second electrically conductive liner lines the second well such thatthe second electrically conductive liner is in physical contact with thefirst electrically conductive liner.
 5. The phase change memory cell ofclaim 4, further comprising a top electrode positioned above the secondwell and in physical contact with the phase change material in thesecond well.
 6. (canceled)
 7. (canceled)
 8. The phase change memory cellof claim 4, wherein the phase change material is deposited in the firstwell and defines a cavity within the second well.
 9. The phase changememory cell of claim 8, further comprising a third non-conductivematerial layer deposited above the phase change material and inside thesecond well.
 10. The phase change memory cell of claim 9, furthercomprising a top electrode positioned above the third non-conductivematerial layer such that the top electrode material is in physicalcontact with the third non-conductively material layer, the phase changematerial layer, and the second electrically conductive liner.
 11. Thephase change memory cell of claim 10, wherein the top electrode includesat least one of Ti, TiN, TaN, and W.
 12. The phase change memory cell ofclaim 1, wherein the conductive liner includes at least one of TiN, TaN,TaAlN, TaSiN, TiAlN, TiSiN, TiCN, and TaCN.
 13. The phase change memorycell of claim 1, wherein the conductive liner has at least twice theelectrical resistance as the phase change material when in a crystallinephase. 14-25. (canceled)
 26. The phase change memory cell of claim 4,wherein the conductive liner lines the bottom of the first well suchthat the conductive liner is physically positioned between the phasechange material and the bottom electrode.
 27. The phase change memorycell of claim 4, wherein the conductive liner includes at least one ofTiN, TaN, TaAlN, TaSiN, TiAlN, TiSiN, TiCN, and TaCN.
 28. The phasechange memory cell of claim 4, wherein the conductive liner has at leasttwice the electrical resistance as the phase change material when in acrystalline phase.